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EMI Pre-Compliance Guide RIGOL Technologies

RIGOL Technologies CO., LTD. 09.09.2021

RIGOL´s new Solution for EMI pre-compliance tests

Enhanced EMI measurement function and a simple user-friendly

operating environment complete RIGOL’s real time spectrum analyzer

versions RSA3000N and RSA5000N.

Electromagnetic compatibility [EMC] has become one of the most important topics in the last

23 years. EMC activities during design phase are absolutely mandatory to ensure the

functionality of development and to protect the environment from electro smog.

Each new development must be tested in a test laboratory in accordance with related

standards in order to be CE certified. This certification is necessary to bring a new product to

the market. Different standards are used depending what kind of product is designed. For

example standard CISPR 22 (EN55022) needs to be passed for an “information technology

equipment” [ITE] like a MP3 player or a modem (telecommunication). Each standard

specifies frequency ranges for conducted and radiated emission of a product and defines

maximum limits in dBµV for each analysis. Pre-compliance analysis is very important during

design stage because it’s estimated that ~50% of products fail the first acceptance test. A

second full compliance test is very expensive and time consuming. But also a re-design has a

strong financial impact and uncalculated additional time is necessary which is a question of

cost in the end as well. In order to avoid this scenario, initial EMC analysis and measurements

are necessary at a very early stage of development and must be carried out throughout

development, including pre-compliance checks. A survey

shows that the average cost of EMC

activities during development is at ~3-5% of whole development cost. However, if these

activities will not be performed and the compliance test is failed, the cost of post-

development can be arise up to 50% to 100% of the actual planned cost. For EMC analysis

and pre-compliance control, RIGOL has been offering since years solution with spectrum

analyzers of the series DSA800 (including 6 dB filters and quasi-peak value detector [QP])

and PC Software S1210, as well as a near-field probe set NFP-3. This solution has now been

extended and optimized in the RSA3000N/RSA5000N series. This makes it possible to

simplify EMC analysis considerably and also offers even more advanced analysis capabilities.

EMI Problematic

EMC

was implemented to generate a peaceful coexistence between transmitter and receiver

of electromagnetic energy. Also unwanted transmitting and receiving are within this

Source: „NF- und HF Messtechnik, Herbert Bernstein, ISBN: 978-3-658-07377-0, edition: 2015, §4.2.1 (page: 269)“

EMC (Electro Magnetic Compatibility) combines EMI (EM Interference) and EMS (EM Susceptibility).

Real-Time Solutions for EMI Pre-Compliance Testing

EMI Pre-Compliance Guide RIGOL Technologies

RIGOL Technologies CO., LTD. 09.09.2021

definition. Furthermore EMC should protect the recourse “electromagnetic spectrum”. Three

main elements are defined in EMI (see figure 1)

The source of interference could come from e.g. parasitic back coupling effects from an

amplifier or an electromagnetic transmission of an electric / electronic facility. Due to

different coupling path the disturbance will be coupled to the susceptible device. This

interference could cause different failure rates in functionality at the EMI receptor

(susceptible device):

1.) Performance degradation

2.) Function failure

3.) Equipment damage (worst case)

To avoid such kind of scenario it is important to detect the root cause including coupling

mechanism at DUT. The EMI interferences could be transmitted via different coupling path.

For lower frequency ranges the interferences are mainly transmitted via line connection (like

for power, data bus, analog lines, RF connection) because the wavelength (λ)

is bigger than

the geometry and electrical and magnetically field are independent. Both fields don’t

propagate and a quasi-static approach is necessary (analysis of inductive / capacitive

elements). The line connections need to be tested if unwanted interferences occurring during

/ after activation of DUT at these lines. This kind of test is named conducted emission.

When the wavelength of a DUT is equal or smaller than its frame, then magnetic and electric

field are no longer independent and they start to combine to an electromagnetic field (EM).

If e.g. the geometry has 6 * λ then the EM field is no longer only at the source, propagation

happens and the DUT start to send out an EM wave (its acting as an antenna). Unwanted

interferences with EM waves are named radiated emission. In the near field of the EM source

a quasi-static approach is necessary.

The occurrence of interferences is in most cases unforeseen and difficult to detect because

different coupling effects could be root cause of interferences. For a device under test there

are two main influences of interferences. First one is an interference which is related within

one DUT and has an influence of functionality within the device under design. These

interferences are intra-system disturbances which will be occurred e.g. crosstalk effects.

Wavelength (λ) of a frequency (f) is defined with the speed of light (C = 3*10

m/sec.): λ = C / f. For example the

wavelength of 1 GHz: λ = 0,3 m (30 cm). With e.g. geometry of 1.2 m a 1 GHz wave (or higher frequencies) will be

propagated.

Source of

Interference

Coupling Path Susceptible

Device

Figure 1: Elements of EMI

EMI Pre-Compliance Guide RIGOL Technologies

RIGOL Technologies CO., LTD. 09.09.2021

On the other side, the DUT might be affecting a complete different independent system with

EMI interferences which are inter-system disturbances. For example, at a radio it could be

happened that a specific noise is hearable over the speaker when a mobile phone is ringing.

Interferences could be coupled by:

- Galvanic coupling (G-C): when two electric circuits using same impedance (e.g. same

GND)

- Inductive coupling (I-C): when two (or more) conductor loops with current flow

influence each other with magnetic field

- Capacitive coupling (C-C): when two electric circuits have different voltage potential

- Electromagnetic coupling (EM-C): Wavelength is smaller than the geometry and EM

wave radiated to environment of DUT and / or other sections of DUT.

To find a root cause coupling path in a DUT is very difficult, because coupling path could also

be a combination of different couplings (e.g. G-C and C-C. at the same time). To find a solution

for a detected coupling path is comparatively simple.

The next part of this document describes the test tool RSA5000N with the new EMI mode

which is the tool for pre-compliance analysis.

EMI Mode of Real Time Spectrum Analyzer RSA5000N / RSA3000N

The RSA5000N / RSA3000N are multifunctional spectrum analyzer including a general

purpose spectrum analyzer [GPSA], a real time analyzer [RTSA], a vector signal analyzer

[VSA], vector network analyzer [VNA] and an EMI mode for pre-compliance tests. Therefore

these devices are the best combination of high performance and flexibility and an optimal

test solution for EMI pre-compliance analysis. For some EMI measurements, the real time

mode could be a big benefit for some analysis to get a better overall picture of the problem

or see more behavior of DUT. The GPSA mode could be used to measure single components

of a DUT like an amplifier and with VSA mode, the modulation quality or BER of an RF output

could be measured e.g. during susceptibility stress.

The new EMI mode offers a lot of new functionalities and advantages for pre-compliance tests

and will be described in detail:

Scan Table

During the conformity check (conducted and radiated emission / susceptibility), a test

receiver [TR] is generally used in a test laboratory. However, a TR has several disadvantages.

It is a very expensive test tool and only usable in the field of EMC. A spectrum analyzer [SA]

on the other hand, measures faster and can be used for different applications and is

significantly cheaper, especially at RIGOL. However, a TR has significant advantages in EMC

measurements comparing to an SA. TR using a pre-selection which allows to use a different

EMI Pre-Compliance Guide RIGOL Technologies

RIGOL Technologies CO., LTD. 09.09.2021

dynamic range for each partial measurement. In addition, the desired frequency resolution

(usually RBW/2 and sometimes RBW/4) is easily achieved in a TR. The SA fulfils the most of

CISPR 16.1 requirements and the results are a very good approximation, which is absolutely

sufficient to perform pre-compliance tests. A TR fulfills CISPR 16.1 for 100% and can also be

used for compliance tests. RIGOL´s new EMI solution in the RSA5000N / RSA3000N

compensates most of the disadvantages with the scan table. The most used frequency ranges

inclusive the correct 6 dB RBW filter for EMC tests are pre-defined in 10 individual ranges

(see figure 2). All pre-defined settings can be modified / stored according to the own need.

In order to compensate these disadvantages in a SA, the EMI solution of RIGOL stores the

basic setting of the most important frequency bands, including the 6 dB RBW required, in a

scan table in advance (see figure 2) in individual areas [Ranges]. All parameters can be

adjusted separately per area according to your own wishes.

For example, it is possible to use up to 10,000 measurement points per area. The basic

settings of measurement points refer to a frequency resolution of RBW/2. For a higher

resolution, different ranges can be combined for one test. With a combination of e.g. 3 ranges

it is possible to use 30.000 measurement points over the whole frequency to reach expected

resolution if necessary. The integrated pre-amplifier (option) and internal attenuator (0 to

50 dB) can be varied per range as well. With combination of different ranges it is possible to

increase the dynamic range of the complete measurement without interrupting the

measurement itself, because the dynamic range can be adjusted for each single range. The

disadvantage of frequency resolution and dynamic range in an SA can be compensated in EMI

mode. Additionally to the standard 3 dB RBW filter, the EMI solution contents also the

Figure 2: Scan table

EMI Pre-Compliance Guide RIGOL Technologies

RIGOL Technologies CO., LTD. 09.09.2021

integrated 6 dB filters (200 Hz, 9 kHz, 120 kHz and 1 MHz). Especially RSA5000N providing

real time and vector signal analysis capabilities, which is not the case with a TR.

Integration of Limits According to Standards

After the desired frequency range has been selected, you can load the pre-defined and stored

limit lines of the desired standard (e.g. EN55022, Class B, AV or/and QP) and display it on the

fully logarithmic trace display. A measuring curve can be assigned to each limit. It is possible

to activate a measurement curve with a separate detector setting for each pass/fail limit.

Different measuring curves can also be measured at the same time. For each limit line it is

possible to activate an additional security margin, which is considered in the Pass/Fail

viewing. Especially in the pre-compliance check the result should be at least 5-6 dB below

the defined limit line to ensure, that the compliance check will be passed.

Advanced Meter/Additional Detectors/Corrections

Another advanced measurement mode is the measurement meter. It is possible to activate

up to 3 meters in parallel. Each of them can be used with different detectors and separate

limit values. For example, the peak value detector [peak] can be set for first meter, second

meter is set to QP detector and third meter to the new CISPR Average [C-AV] detector. The

respective measuring meters can be set to the peak under focus via meter marker. The

meters measures continuously. This means, for example, with an elevated peak value, the

DUT can be reworked and the influence on this value can be immediately represented. A

design improvement is immediately visible. With using three meters in parallel it is possible

to see the peak measurement (worst case) but also the repetition pulse rate of this signal

over a certain time with QP detector can be displayed. In addition a weighted average

detector can be used for pulsed sinus-shaped signals with low repetition rate (C-AV

) which

displays the maximum linear average value during the measurement.

The meters can be coupled with a signal which is selected in the signal table. An additional

fine-tuning of the meter frequency is not necessary. So each peak in signal table can be

selected and measured by marker, as well. Alternatively, the meters could be coupled to a

marker. For conducted emission tests additional components are used (e.g. line stabilization

network (LISN) transient limiters, external attenuator, etc.). Each of the components has a

direct influence of test result over frequency range. Therefore, it is possible to activate

different corrections in RSA3000N / RSA5000N EMI mode. During the test, the correction

will be respected in the result. Correction values can be stored internal the instrument, as a

* .csv file. These can also be generated in the PC and loaded later on into the analyzer.

CISPR Average detector is a new definition in CISPR16.1 and replaces the Average detector for some standards. C-

AV contents an instrument time constant according used low pass filter for Band A, B, C/D and E. IF bandwidths are

the same as for QP (200 Hz, 9 kHz, 120 kHz, 1 MHz). C-AV is used to measure low frequency pulsed sinusoidal

signals (signals with fp < 6Hz). C-AV is calibrated with unmodulated sinusoidal signal (rms).

EMI Pre-Compliance Guide RIGOL Technologies

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Measurement

Different conditions can be set for the measurement. On the one hand, variable traces can be

recorded at the same time with one or more detectors. Alternatively, only the worst case

situation (peak detector) can be recorded. Afterwards each peak in the signal table will be

measured with QP and C-AV detector, as well. It is no longer necessary to perform a whole

trace with QP and C-AV (duration can be several hours) because these detectors are only

interesting when peaks are visible and the test engineer has the information in some minutes

and saves a lot of time during pre-compliance evaluation.

The number of readings in the signal table can be pre-defined. In order to get a detailed view

of a peak value, a zoom is available to enlarge a detailed view of a peak. After analysis, the

view can be zoomed out to get back the original view.

In case that the full screen of the trace is required, the measurement meter and the signal

table can be turned off on the screen.

Figure 3: View of EMI measurement with the trace, meters (right side) and signal table (below) with results

EMI Pre-Compliance Guide RIGOL Technologies

RIGOL Technologies CO., LTD. 09.09.2021

Documentation

In the EMI mode of RSA5000N / RSA3000N series, the measurements can be stored in

different ways. For example, the complete signal trace can be stored as a * .csv file or a test

report including settings, limits , an image of the graph including meter result and the signal

table can be created as HTML or *.pdf in the analyzer itself or on an external USB stick. It is

possible to modify the header of the test report with information like temperature /

humidity, name of operator or test location, etc.

The next part of this document will go through some measurement examples with conducted

/ radiated emissions and near field probing.

Conducted Emission

As already mentioned, conducted emission is mainly measured up to 30 MHz at lines (e.g.

power, analog / digital signals, etc.). For conducted emission test on power line it is necessary

to supply the DUT with power. At the same time the disturbances from DUT shall be

measured. The problematic is, that also from the power supply disturbances could be send

out which shall not be measured. Another aspect is the impedance matching to avoid a wrong

result based on an impedance mismatch. The solution for this problematic is the usage of a

line impedance stabilization network [LISN]. A LISN blocks all interferences (via inductive

component) from power supply to SA, but supplies a DUT with power. Depending on

inductive size, a LISN can be used for DC (5 µH) or AC (50 µH) power source. The power will

Figure 4: Zoom View of a Peak Signal

EMI Pre-Compliance Guide RIGOL Technologies

RIGOL Technologies CO., LTD. 09.09.2021

be blocked on the way to SA (via a capacitance) but the DUT disturbances won’t be blocked

and transferred to the SA. The impedance at SA connection is 50 Ω.

Two security mechanisms are important using a LISN. When a LISN or a DUT will be

activated, then the electric charge of capacitance changing and current flows for a short

period. This transient current can destroy the first mixer diode in a spectrum analyzer. It is

recommended to use a transient limiter between LISN and SA, to protect the analyzer

. For

the first test it is also recommended to use an external attenuator for the test to see if high

disturbances will be occur from DUT. The attenuator can be removed after first test, when

the user be sure, that the disturbance peaks are at a normal level.

In each standard it is defined how the test setup has to be performed. In figure 6 there is the

physical connection of a test setup displayed:

Several LISN already have a transient limiter integrated. Please check data sheet of a LISN for more information

Figure 5: Block Diagram of an AC LISN

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Figure 6: Physical connections for conducted emission EMC testing

The ground connection of LISN (and DUT if possible) needs to be connected to the horizontal

ground plane.

In the example below the conducted emission test was performed on a power supply (Phase)

of a test device using a 50µH AC LISN

. First test was performed with integrated LISN limiter

and the second test in figure 7 was performed without limiter. The limit lines and detectors

are selected for standard EN55022, Class B. The test result is including correction values of

LISN. This test uses two limit lines. First one is for average detector and second (blue) limit

line is for QP detector. For information only, the peak detector was also activated for final

measurement, because the peak detector displays always the worst case value. This power

supply is very close below the limit margin, but it passed. Higher peaks can be analyzed via

measure meter.

TEKBOX TBLC08

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Additionally to EMI analysis the frequency band can be analyzed in real time [RT] as well.

This mode uses a very fast FFT algorithm to calculate the frequency spectrum. The calculation

time is smaller than one FFT frame. Therefore a seamless capture of time signal is possible

and no signal information

will be lost. In RT mode different displays can be used. For

example within density mode it is possible, to see a signal repetition over test time in

different color grades and therefore it’s possible to see more details. Density or Normal view

could be combined with spectrogram (time waterfall over frequency range) where different

amplitude values are displayed in diverse color grades (see figure 8).

POI: 7,45 µsec @40 MHz RTBW

Figure 7: Conducted emission test (acc. to EN55022, Class B) for a power supply of an ITE device

EMI Pre-Compliance Guide RIGOL Technologies

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An additional strong tool is the combination of frequency view and power vs time (with

bandwidth up to 40 MHz

) in parallel. For a SA it is only possible to view the frequency

spectrum or zero span with the max bandwidth of used RBW but not both in parallel. In

figure 9 the same DUT was tested with smaller frequency range and with normal spectrum

in combination of spectrogram. For this measurement it’s possible to speed up test time to

100 µsec. The interference pulses are now visible in spectrogram. With a Z marker it is

possible to measure the difference in frequency, amplitude and time of an interference signal.

RSA5000: Standard BW is 25 MHz, 40 MHz is an option. RSA3000: Standard BW is 10 MHz, 25 MHz or 40 MHz is an

option

Figure 8: Real-time view (Density Spectrogram) of a power supply with interferences in low frequency range

EMI Pre-Compliance Guide RIGOL Technologies

RIGOL Technologies CO., LTD. 09.09.2021

Figure 10: NFP-3 (near field probe set) for EMI debugging

Near Field Probing

Near field analysis is a very important part in pre-compliance analysis and root cause

debugging. RIGOL offers with the set of near fields (NFP-3) 4 different H probes for failure

detection (see figure 10). It is a special form of emission analysis, because the measurement

is done in reactive nearfield range (up to 0.159 * λ)

. In near field magnetic and / or electric

field needs to be measured separately because both have a phase shift of up to 90° and

nearfield stores blind energy without radiation. For most radiated emission root causes can

be detected with locating the near field strength.

Near field distance of 3 GHz: up to 0,0159 m (1,59 cm); near field distance of 30 MHz: up to 1,59 m

Figure 9: Interference measurement of power supply with acq. time of 143 µsec and Z marker evaluation

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Figure 11: First overview of DUT interferences with near field probing

Tests on housing leakage could be detected as well as strong disturbance components like

ribbon cables or LCD panels. Bigger probes are usable to find the area of interferences.

Smaller probes can be used to detect the exact source.

One approach for near field analysis is to use the spectrum analyzer with linear frequency

scale / no limit lines and test e.g. a frequency range of 30 MHz to 500 MHz with a RBW of 100

kHz and activation of pre-amplifier (internal attenuator: 0 dB) to get a first view the

interference peaks of DUT (see figure 11).

Radiated Emission

According to the description at the beginning, propagation starts when λ is small to the

geometry and E & H are no longer independent. Both are in-phase and propagate to the

environment. Radiated emission is not easy to test. In a test laboratory a big hermetic test

chamber is used where far field conditions are fulfilled and other influences (due to external

components like a mobile phone, etc.) are not visible in the result. Far field condition starts

with a distance of 4 * λ and the characteristic wave impedance is 120 * π Ω (= 377 Ω). The

hermetic room has in most cases at the wall broadband absorber for impedance matching of

EM wave to avoid reflections. The altitude of broad band antenna can be changed during a

test to find the highest peak at DUT during the test

Because of „2 way propagation“ with direct beam and one reflection point on earth

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In most cases such kind of test chamber is not available for pre-compliance analysis.

Therefore alternative ways has to be evaluated.

First of all, it is possible perform a free field measurement with the distance of radiated near

field which is defined for 0.159 * λ to 4 * λ. In this region a far field evaluation is possible (with

using correction values). To detect the test area attenuation

from environment it is possible

to perform a test with a counter antenna instead of DUT and the results will be compared

with defined formula of theoretical value. The difference is the test area attenuation.

Depending on the distance between antennas, variable correction factors are used. This test

needs a very good conductive ellipsis area

. There shall be no conductive obstacles greater

than 5 cm within the ellipsis (see figure 12). DUT and test antenna are located within the

focus of ellipsis. It is necessary to perform an altitude variation of test antenna to detect

maximum.

This test is very time intensive and expensive. A more simple way of radiated emission

analysis for pre-compliance test is, to use a TEM cell.

It could happen that obstacles outside the ellipsis occurs unwanted reflections. Therefore the test area

attenuation needs to be evaluated, first.

This could be realized with metal foil or with a wire mesh area

Figure 12: free field measurement for radiated emission

Figure 13: Double port TEM cell

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A characteristic for radiation of antennas is the far field. According to the description above,

the characteristic wave impedance Z

= E / H which is in far field, is 377 Ω. The idea of a TEM

cell is the medium of a coax cable which is suitable for a TEM wave propagation. The

characteristic wave impedance in a coax cable is independent of the mechanical structure

and always 377 Ω. A TEM cell is displayed in figure 13

. A common use for pre-compliance

analysis is, to use an open TEM cell with disadvantage to see influence from environment.

But this could be evaluated as a reference measurement with deactivated DUT. The two

bends on the roof are necessary for the matching, but results into a frequency limit (max

frequency range) is the cut off frequency based on the generation of higher wave guide modes

on these bends which have an influence on test results. This cell can be used for susceptibility

stress of a DUT but can also be used for repeatable pre-compliance radiated emission

approximations which are sufficient for pre-compliance analysis. The connection to a

spectrum analyzer needs a DC blocker because the lowest cut off frequency of a coaxial cable

is 0 Hz (= DC) which could destroy a spectrum analyzer. For impedance matching of septum

it is necessary to use a 50 Ω Termination on second port to avoid reflections. The DUT is

placed between septum and lower shielding plate. A test setup is visible in figure 14. The

advantage of open TEM cells, failures can also be analyzed in parallel with a near field probe

to detect the root cause area of DUT.

TEM wave is a transversal electromagnetic wave which describes a homogeneous plane wave.

Source of picture: „Elektromagnetische Verträglichkeit, Adolf J. Schwab / Wolfgang Kürner, ISBN: 978-3-642-

16609-9, edition: 6, §5.7.3 (page: 231)“

Septum of TEM cell is the center core of coaxial structure. The mechanical design is to reach the impedance of

50 Ω over specified frequency range.

Figure 14

Repeatable radiated emission analysis with an open TEM cell

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Susceptibility Analysis

Near field probes, current probes and TEM cells can also be used for conducted / radiated

susceptibility stress of a DUT. RIGOL’s RF generator series DSG800 or DSG3000B are an

optimal tool in combination with those components, to stress a DUT with an amplitude

modulation [AM] e.g. according to IEC 61000-4-3

, A functionality during stress might be

controlled via the oscilloscope MSO8000 to see e.g. influence to jitter of clock signals or

wrong decoding of bus systems or to see crosstalk effects on strip lines. Conducted

susceptibility could be done with a current probe over the related stress cable. Also the real

time spectrum analyzer can be used to measure, in parallel, sporadic interference reaction at

DUT due to susceptibility stress. The real time functionality offers different trigger types. One

is the frequency mask trigger [FMT] which is a defined field (different color) and the RTSA

measures only, when the conditions of the field is fulfilled (e.g. measure, when a signal is

inside the FMT field, see figure 15).

Sine wave, 1 kHz, 80% modulation depth, sweep from 80 kHz to 1 MHz

Figure 15: Measurement of sporadic interference reaction due to susceptibility stress

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The quality of digital modulation of RF interface during absorption stress can be tested via

RSA5000N VSA (see figure 16). Here it is possible to display also I and Q stream separately

to see which part of transmitter is affected by the interference. Additionally a BER test could

be performed during stress situation.

Additionally, with the vector network analyzer function [VNA] it is possible to measure out

related antennas or other components to see if a possible degradation of performance is

visible (see figure 17).

Figure 16: Digital modulation analysis at RF interface during stress situation

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Figure 17: VNA Mode with different window of S

parameter like smith- and Polar Plane, logarithm. Magnitude and SWR

Summary

RIGOL offers a new dimension of pre-compliance testing with the new EMC solution for the

series RSA3000N/RSA5000N. With the additional meter measurement method high peak

values can be determined and improved at a very early design stage. This test solution

eliminates the need for PC test software. The EMV analysis is also greatly simplified by the

pleasant operation of the device (touchscreen or operator panel as well as USB mouse or USB

keyboard). In addition, the real-time capacities (real-time is integrated as standard) of the

RSA series provide an expanded insight into EMC analysis.

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